Rafael Ben Ami
1Patents
1h-index
3Co-inventors
25Inventor score
Filing activity: Feb 18, 2020 → Feb 18, 2020
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US11423529B2 | Determination of defect location for examination of a specimen | Emerging Cross-Sectional Technologies | 1 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.