Ramdane Benferhat
3Patents
2h-index
5Co-inventors
37Inventor score
Filing activity: Feb 27, 1996 → Jan 18, 2008
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5666200A | Method of ellipsometric measurement, an ellipsometer and device for controlling the carrying out of layers using such method and apparatus | Electricity | 14 | Expired |
| US7184145B2 | Achromatic spectroscopic ellipsometer with high spatial resolution | Physics | 7 | Expired |
| US8310675B2 | System and process for analyzing a sample | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.