Inventor · Newburgh, NY, US

Richard Wise

1Patents
1h-index
3Co-inventors
25Inventor score

Filing activity: Jul 31, 2006 → Jul 31, 2006

Most-cited inventions

PatentTitleAreaCited byStatus
US7754615B2 Method and apparatus for detecting endpoint in a dry etching system by monitoring a superimposed DC current Electricity 3 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.