Robert William Koss
4Patents
4h-index
8Co-inventors
39Inventor score
Filing activity: Dec 21, 1993 → May 7, 1999
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5600257A | Semiconductor wafer test and burn-in | Physics | 114 | Expired |
| US6351134B2 | Semiconductor wafer test and burn-in | Physics | 69 | Expired |
| US5929651A | Semiconductor wafer test and burn-in | Physics | 48 | Expired |
| US5419708A | Printed circuit card with minor surface I/O pads | Electricity | 16 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.