Sergey Borodyansky
3Patents
2h-index
10Co-inventors
41Inventor score
Filing activity: Jul 9, 1999 → Oct 22, 2015
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6399944B1 | Measurement of film thickness by inelastic electron scattering | Physics | 59 | Expired |
| US10726169B2 | Target and process sensitivity analysis to requirements | Physics | 3 | Active |
| US6635869B2 | Step function determination of Auger peak intensity | Physics | 0 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.