Simon Hees
1Patents
1h-index
2Co-inventors
22Inventor score
Filing activity: Nov 2, 2011 → Nov 2, 2011
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US8426812B2 | Microscope system, method for operating a charged-particle microscope | Electricity | 3 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.