Sonja Radelow
1Patents
1h-index
4Co-inventors
25Inventor score
Filing activity: Jan 5, 2000 → Jan 5, 2000
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6490033B1 | Method of thin film process control and calibration standard for optical profilometry step height measurement | Physics | 3 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.