Stefano E. Concina
6Patents
6h-index
8Co-inventors
52Inventor score
Filing activity: Nov 23, 1988 → Jun 11, 2001
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6066849A | Scanning electron beam microscope | Electricity | 58 | Expired |
| US5869833A | Electron beam dose control for scanning electron microscopy and critical dimension measurement instruments | Electricity | 53 | Expired |
| US5054097A | Methods and apparatus for alignment of images | Physics | 41 | Expired |
| US6570154B1 | Scanning electron beam microscope | Electricity | 15 | Expired |
| US6211518A | Electron beam dose control for scanning electron microscopy and critical dimension measurement instruments | Electricity | 13 | Expired |
| US5127064A | High resolution image compression methods and apparatus | Physics | 12 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.