Stephen Beaudoin
3Patents
2h-index
8Co-inventors
37Inventor score
Filing activity: Jun 5, 2003 → Sep 18, 2015
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6811471B2 | Abrasive particles to clean semiconductor wafers during chemical mechanical planarization | Electricity | 6 | Expired |
| US9243445B2 | Protective window shutter | Fixed Constructions | 4 | Active |
| US10794796B2 | Engineered detection swab | Physics | 1 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.