Steve Herrmann
3Patents
2h-index
5Co-inventors
33Inventor score
Filing activity: Apr 29, 2000 → Apr 30, 2007
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6937753B1 | Automated wafer defect inspection system and a process of performing such inspection | Electricity | 55 | Expired |
| US8097966B2 | Adjustable film frame aligner | Electricity | 2 | Active |
| US7316938B2 | Adjustable film frame aligner | Electricity | 2 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.