Sunhong Jun
2Patents
0h-index
7Co-inventors
24Inventor score
Filing activity: Dec 23, 2021 → Mar 8, 2023
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US12332164B2 | Dual resolution spectrometer, and spectrometric measurement apparatus and method using the spectrometer | Physics | 0 | Active |
| US11921270B2 | Inspection system including reference specimen and method of forming semiconductor device | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.