Taizo Wakimura
4Patents
2h-index
14Co-inventors
41Inventor score
Filing activity: Mar 11, 2010 → Oct 2, 2019
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US8654242B2 | Single-focus optical system, image pickup device, and digital apparatus | Physics | 12 | Active |
| US8659838B2 | Image pickup lens, image pickup device provided with image pickup lens, and mobile terminal provided with image pickup device | Physics | 4 | Active |
| US10768118B2 | Surface defect inspection device and method | Physics | 1 | Active |
| US12236576B2 | Workpiece surface defect detection device and detection method, workpiece surface inspection system, and program | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.