Taku Minakata
1Patents
1h-index
1Co-inventors
22Inventor score
Filing activity: Sep 8, 2006 → Sep 8, 2006
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7672501B2 | Substrate inspection system including a visual inspection device for inspection by image processing | Physics | 3 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.