Inventor · San Francisco, CA, US

Thomas Vavul

4Patents
3h-index
7Co-inventors
43Inventor score

Filing activity: Sep 19, 1997 → Feb 1, 2013

Most-cited inventions

PatentTitleAreaCited byStatus
US6076465A System and method for determining reticle defect printability Physics 76 Expired
US6381358B1 System and method for determining reticle defect printability Physics 7 Expired
US6731787B1 System and method for determining reticle defect printability Physics 3 Expired
US10401305B2 Time-varying intensity map generation for reticles Physics 0 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.