Tsu-bin Shen
2Patents
2h-index
4Co-inventors
27Inventor score
Filing activity: Jan 24, 2000 → Jan 5, 2001
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6150235A | Method of forming shallow trench isolation structures | Electricity | 10 | Expired |
| US6396751B1 | Semiconductor device comprising a test structure | Physics | 2 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.