Vigyan Singhal
14Patents
12h-index
13Co-inventors
71Inventor score
Filing activity: Jul 17, 1998 → Nov 5, 2008
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7159198B1 | System and method for identifying design efficiency and effectiveness parameters for verifying properties of a circuit model | Physics | 39 | Expired |
| US6308299A | Method and system for combinational verification having tight integration of verification techniques | Physics | 32 | Expired |
| US7137078B2 | Trace based method for design navigation | Physics | 25 | Expired |
| US7065726B1 | System and method for guiding and optimizing formal verification for a circuit design | Physics | 24 | Expired |
| US7412674B1 | System and method for measuring progress for formal verification of a design using analysis region | Physics | 24 | Expired |
| US7895552B1 | Extracting, visualizing, and acting on inconsistencies between a circuit design and its abstraction | Physics | 22 | Expired |
| US7418678B1 | Managing formal verification complexity of designs with counters | Physics | 21 | Expired |
| US6611947B1 | Method for determining the functional equivalence between two circuit models in a distributed computing environment | Physics | 20 | Expired |
| US8572539B2 | Variability-aware scheme for high-performance asynchronous circuit voltage regulation | Physics | 20 | Active |
| US7020856B2 | Method for verifying properties of a circuit model | Physics | 17 | Expired |
| US6247163A | Method and system of latch mapping for combinational equivalence checking | Physics | 16 | Expired |
| US6993730B1 | Method for rapidly determining the functional equivalence between two circuit models | Physics | 13 | Expired |
| US7701255B2 | Variability-aware scheme for asynchronous circuit initialization | Physics | 12 | Active |
| US7647572B1 | Managing formal verification complexity of designs with multiple related counters | Physics | 9 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.