Inventor · Yokohama, JP

Wataru Okamoto

19Patents
4h-index
24Co-inventors
60Inventor score

Filing activity: May 20, 1993 → Feb 15, 2023

Most-cited inventions

PatentTitleAreaCited byStatus
US6865508B2 Log analysis method and recording medium storing log analysis program Physics 29 Expired
US5386573A Single chip microcomputer with interrupt processing capability during hold states Physics 25 Expired
US7089536B2 Computer system and method for aiding log base debugging Physics 12 Expired
US8583859B2 Storage controller for wear-leveling and compaction and method of controlling thereof Physics 4 Active
US9092324B2 Memory system and method for controlling a nonvolatile semiconductor memory Physics 3 Active
US8108593B2 Memory system for flushing and relocating data Physics 3 Active
US7050942B2 Object state classification method and system, and program therefor Physics 2 Expired
US8745313B2 Memory system and method for controlling a nonvolatile semiconductor memory Physics 2 Active
US10438668B2 Power supply management device and memory system Physics 2 Active
US8185756B2 System and method for transmitting a power control signal to an external device based on the presence of linkage information Electricity 2 Active
US10748580B2 Information processing apparatus Electricity 1 Active
US8866933B2 Imaging device Electricity 1 Active
US9118829B2 Imaging device Electricity 1 Active
US9417799B2 Memory system and method for controlling a nonvolatile semiconductor memory Physics 0 Active
US12035042B2 Communication control device and imaging apparatus Electricity 0 Active
US11573169B2 Method of testing a semiconductor element with improved pressing force direction Physics 0 Active
US11302362B2 Information processing apparatus Electricity 0 Active
US12106529B2 Imaging apparatus Physics 0 Active
US8671257B2 Memory system having multiple channels and method of generating read commands for compaction in memory system Physics 0 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.