Inventor · Huizhou, CN

Wei Li

4Patents
1h-index
13Co-inventors
37Inventor score

Filing activity: May 13, 2016 → Jan 3, 2023

Most-cited inventions

PatentTitleAreaCited byStatus
USD797745S1 Scanner General 17 Active
US11469076B2 System and method for scanning a sample using multi-beam inspection apparatus Electricity 0 Active
US12298133B2 High-resolution handheld OCT imaging system Human Necessities 0 Active
US12165837B2 System and method for scanning a sample using multi-beam inspection apparatus Electricity 0 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.