Weihua Yin
5Patents
2h-index
11Co-inventors
44Inventor score
Filing activity: Nov 12, 2009 → Sep 1, 2022
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US8725115B2 | Method and system for processing message | Electricity | 16 | Active |
| US11152191B2 | In-lens wafer pre-charging and inspection with multiple beams | Electricity | 2 | Active |
| US12165837B2 | System and method for scanning a sample using multi-beam inspection apparatus | Electricity | 0 | Active |
| US12374524B2 | In-lens wafer PE-charging and inspection with multiple beams | Electricity | 0 | Active |
| US11469076B2 | System and method for scanning a sample using multi-beam inspection apparatus | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.