William H. Broadbent
2Patents
2h-index
4Co-inventors
27Inventor score
Filing activity: May 9, 1983 → Jun 20, 1983
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US4579455A | Photomask inspection apparatus and method with improved defect detection | Physics | 184 | Expired |
| US4555798A | Automatic system and method for inspecting hole quality | Physics | 140 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.