William J. Tee
1Patents
1h-index
1Co-inventors
22Inventor score
Filing activity: Jul 27, 1978 → Jul 27, 1978
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US4180738A | Astigmatism in electron beam probe instruments | Electricity | 16 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.