William VanHoomissen
3Patents
1h-index
6Co-inventors
33Inventor score
Filing activity: Nov 6, 2013 → Feb 8, 2019
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US9255894B2 | System and method for detecting cracks in a wafer | Physics | 4 | Active |
| US10522426B1 | Haze mask system for haze suppression | Physics | 0 | Active |
| US11524319B2 | Apparatus and method for cleaning wafer handling equipment | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.