Xiaohan Li
4Patents
0h-index
23Co-inventors
34Inventor score
Filing activity: Oct 21, 2016 → Aug 8, 2023
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US12406197B2 | Prediction and metrology of stochastic photoresist thickness defects | Physics | 0 | Active |
| US9921159B2 | Spliced detection apparatus for simultaneous wide-range in-situ detection of dissolved oxygen in sludge-water interface and detection method therefor | Physics | 0 | Active |
| US11966156B2 | Lithography mask repair by simulation of photoresist thickness evolution | Physics | 0 | Active |
| US9939380B2 | Detection device and method for simultaneous in-situ measurement of dissolved oxygen at different submerged plant leaf-water interface levels | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.