Yao-Wei Tien
1Patents
1h-index
2Co-inventors
22Inventor score
Filing activity: Feb 2, 2015 → Feb 2, 2015
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US9734572B2 | System and method for defect analysis of a substrate | Physics | 2 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.