Yi Feng
6Patents
4h-index
4Co-inventors
42Inventor score
Filing activity: Aug 12, 2009 → Dec 19, 2017
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US8350583B2 | Probe-able voltage contrast test structures | Physics | 84 | Active |
| US9213060B2 | Probe-able voltage contrast test structures | Physics | 59 | Active |
| US9103875B2 | Probe-able voltage contrast test structures | Physics | 58 | Active |
| US9097760B2 | Probe-able voltage contrast test structures | Physics | 58 | Active |
| US10142319B2 | Protecting network communication security | Electricity | 0 | Active |
| US9860232B2 | Protecting network communication security | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.