York Oberdoerfer
15Patents
3h-index
20Co-inventors
56Inventor score
Filing activity: Sep 28, 2005 → Jan 7, 2019
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US8714018B2 | Method for the non-destructive testing of a test object by way of ultrasound and corresponding device | Physics | 5 | Active |
| US8183493B2 | Ultrasonic system for monitoring a weld operation | Physics | 5 | Active |
| US9157895B2 | Systems and methods for viewing data generated by rotational scanning in non-destructive testing | Physics | 4 | Active |
| US8997590B2 | Multi-part mounting device for an ultrasonic transducer | Physics | 3 | Active |
| US9335302B2 | Probe approach for DGS sizing | Physics | 3 | Active |
| US9244043B2 | Integrated active ultrasonic probe | Physics | 2 | Active |
| US9442097B2 | Systems and methods for viewing data generated by rotational scanning in non-destructive testing | Physics | 2 | Active |
| US9869660B2 | Systems and methods for viewing data generated by rotational scanning in non-destructive testing | Physics | 1 | Active |
| US10175207B2 | Probe approach for DGS sizing | Physics | 1 | Active |
| US8770027B2 | Pulse-echo method by means of an array-type probe and temperature compensation | Physics | 1 | Active |
| US9664651B2 | Probe approach for DGS sizing | Physics | 0 | Active |
| US10768147B2 | Probe approach for DGS sizing | Physics | 0 | Active |
| US9404897B2 | Method for the non-destructive inspection of a test object of great material thickness by means of ultrasound, the use of a test probe for carrying out the method, an ultrasonic test probe, a control unit for an ultrasonic test probe and a device for the non-destructive inspection of a test object of great material thickness by means of ultrasound | Physics | 0 | Active |
| US10502716B2 | Systems and methods for viewing data generated by rotational scanning in non-destructive testing | Physics | 0 | Active |
| US8739630B2 | Pulse-echo method for determining the damping block geometry | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.