Yun Xi
1Patents
0h-index
7Co-inventors
19Inventor score
Filing activity: Feb 22, 2021 → Feb 22, 2021
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US11599437B2 | Method and system for intelligent failure diagnosis center for burn-in devices under test | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.