Zaifa Zhou
2Patents
0h-index
6Co-inventors
24Inventor score
Filing activity: May 5, 2015 → Feb 11, 2018
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US10088375B2 | Thin film material residual stress testing structure and method | Electricity | 0 | Active |
| US11002710B2 | Method and device for measuring mechanical parameters of multilayer composite thin film structure | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.