Inventor · Chengdu, CN

Zhu An

1Patents
0h-index
4Co-inventors
19Inventor score

Filing activity: Feb 8, 2023 → Feb 8, 2023

Most-cited inventions

PatentTitleAreaCited byStatus
US11774380B1 Diffraction analysis device and method for full-field x-ray fluorescence imaging analysis Physics 0 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.