Metrology system for positioning assemblies
US10000298B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 3, 2014 |
| Grant date | Jun 19, 2018 |
| Priority date | — |
| Expiry date | Jul 20, 2036 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY02P90/80
- WIPO fieldControl
- WIPO sectorInstruments
Abstract
A method and apparatus for maintaining a selected configuration for a structure during a manufacturing process for forming a product using the structure. Metrology data for a support system is received. The support system holds the structure during the manufacturing process. A determination is made as to whether a current configuration of the structure is within selected tolerances of the selected configuration for the structure based on the metrology data. The support system is reconfigured to move the structure into the selected configuration in response to a determination that the current configuration of the structure is not within the selected tolerances of the selected configuration for the structure.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.