Methods and apparatuses for measuring material phase properties
US10001435B1 · kind B1 · utility
3Cited by
6References
20Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Apr 7, 2017 |
| Grant date | Jun 19, 2018 |
| Priority date | — |
| Expiry date | Apr 7, 2037 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N1/4022
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Methods and apparatuses for determining a material characteristic of a sample material are disclosed. A sample material is loaded to a plurality of cells. An interference material is disposed relative to the sample material such that the interference material at least retards the transport of the sample material from a one of the cells to at least another one of the cells. For each one of the cells, independently: a stimulus is applied to the sample material in the cell such that a conditioned sample material is obtained; and a material characteristic of the conditioned sample material is sensed.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.