Patent · US Active

Method and electronic device for improving accuracy of measurement of motion sensor

US10001505B2 · kind B2 · utility

0Cited by

5References

18Claims

0Family size

Assignee

SAMSUNG ELECTRONICS CO., LTD. · KR

Inventors

Swarna Ravindra Babu · Chennai, IN
C Rakesh · Bengaluru, IN
C Dhineshkumar · Bengaluru, IN
Y Megha Swaroop · Bengaluru, IN
Arun Kumar Siddanahalli Ninge Gowda · Bengaluru, IN
Deepak Bhatt · Dehradun, IN

Key dates

Filing date	Mar 7, 2016
Grant date	Jun 19, 2018
Priority date	—
Expiry date	Aug 20, 2036

Classification

Technology area (CPC G)Physics
CPC primaryG01C25/005
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A method of improving accuracy of measurements of at least one motion sensor included in an electronic device, including receiving a candidate measurement associated with the electronic device from the at least one motion sensor; detecting an electronic device state associated with the electronic device, the electronic device state including one from among a static state and a motion state; computing a compensation parameter based on the candidate measurement and the electronic device state; and correcting the candidate measurement based on the computed compensation parameter.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.