Patent · US Active

Semiconductor devices and methods for dead time optimization by measuring gate driver response time

US10003260B2 · kind B2 · utility

1Cited by

13References

14Claims

0Family size

Assignee

NXP USA, Inc. · US

Inventors

Dirk Rowald · Munich, DE
Hubert M. Bode · Haar, DE

Key dates

Filing date	Jun 23, 2015
Grant date	Jun 19, 2018
Priority date	—
Expiry date	Aug 8, 2035

Classification

Technology area (CPC H)Electricity
CPC primaryH02M1/385
WIPO fieldElectrical machinery, apparatus, energy
WIPO sectorElectrical engineering

Abstract

Switching control devices and related operating methods are provided. An exemplary electronic device includes a semiconductor die, a driver arrangement on the semiconductor die to generate a switch control output signal based on an input switching command signal, and a timer arrangement on the semiconductor die and coupled to the driver arrangement to measure a time difference between a first change in the command signal and an exhibited response in the switch control signal, which can then be utilized to achieve a desired dead time.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.