Recording medium, method of manufacturing fullerene thin film, recording reproducing apparatus, information recording method, and information reading method
US10008232B2 · kind B2 · utility
0Cited by
2References
11Claims
0Family size
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Key dates
| Filing date | Jun 28, 2016 |
| Grant date | Jun 26, 2018 |
| Priority date | — |
| Expiry date | Jun 28, 2036 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11B9/149
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
According to the present invention, there is provided a recording medium comprising a substrate, a platinum layer formed on the substrate and having a (111) plane preferentially oriented, and a fullerene single crystal thin film formed on the platinum layer, and configured to be a recording layer, wherein an average value of average surface roughness Ra's with respect to four or more visual fields measured by using an atomic force microscope in a surface of the fullerene thin film is 0.5 nm or less.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.