Portable diffraction-based imaging and diagnostic systems and methods
US10012589B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Aug 18, 2014 |
| Grant date | Jul 3, 2018 |
| Priority date | — |
| Expiry date | Aug 18, 2034 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG03H2001/0447
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The disclosure features systems and methods for measuring and diagnosing target constituents bound to labeling particles in a sample. The systems include a radiation source, a sample holder, a detector configured to obtain one or more diffraction patterns of the sample each including information corresponding to optical properties of sample constituents, and an electronic processor configured to, for each of the one or more diffraction patterns: (a) analyze the diffraction pattern to obtain amplitude information and phase information corresponding to the sample constituents; (b) identify one or more particle-bound target sample constituents based on at least one of the amplitude information and the phase information; and (c) determine an amount of at least one of the particle-bound target sample constituents in the sample based on at least one of the amplitude information and the phase information.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.