High frequency time domain reflectometry probing system
US10012686B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Aug 15, 2016 |
| Grant date | Jul 3, 2018 |
| Priority date | — |
| Expiry date | Aug 15, 2036 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01R13/71
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A probe includes a self-aligning connector set, a moveable probe tip, a cable, a housing, and a spring. When the probe tip is pressed to a test point on a device-under-test, the probe tip moves within the housing to cause a first connector and a second connector of the self-aligning connector set to be connected through an adapter of the self-aligning connector set, thereby establishing a signal path through the probe. The first connector, second connector, and adapter are structured so that their respective ground conductors become connected prior to their respective signal conductors becoming connected. Electro-static charge present at the test point is safely discharged through a resistor to ground before the signal path through the probe is established, thereby preventing damage to the probe and connected host instrument. When the probe tip is removed from the device-under-test, the spring forces a disconnection of the first and second connectors.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.