Patent · US Active

Enhancing spectral purity in high-speed testing

US10012694B2 · kind B2 · utility

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7References
10Claims
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Key dates

Filing dateApr 27, 2016
Grant dateJul 3, 2018
Priority date—
Expiry dateApr 27, 2036

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R31/3191
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A technique for testing an electronic UUT by a test apparatus includes obtaining multiple DFTs of a test signal received from the UUT with the test apparatus configured differently for obtaining each DFT. The resulting DFTs include both valid content representing the test signal and invalid content introduced by the test apparatus. The improved technique suppresses the invalid content by generating a corrected DFT, which provides minimum magnitude values for corresponding frequencies relative to the test signal across the multiple DFTs.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.