X-ray direct conversion detector with additional radiation illumination

US10014430B2 · kind B2 · utility

Assignee

• Siemens Aktiengesellschaft · DE

Inventors

• Peter Hackenschmied · Nuremberg, DE
• Edgar Göderer · Forchheim, DE
• Christian Schröter · Bamberg, DE
• Matthias Strassburg · Erlangen, DE
• Stefan Wirth · Erlangen, DE

Key dates

• Filing date: Jul 10, 2013
• Grant date: Jul 3, 2018
• Expiry date: Feb 21, 2035

Classification

• Technology area (CPC G): Physics
• CPC primary: G01T1/244
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

A method is disclosed for detecting incident X-ray radiation by way of a direct-converting X-ray radiation detector. A semi-conductor material used for detection purposes is irradiated with additional radiation with an energy level of at least 1.6 eV in order to produce additional charge carriers. A direct-converting X-ray radiation detector is disclosed for detecting X-ray radiation, at least including a semi-conductor material used for X-ray detection and at least one radiation source which irradiates the semi-conductor material with additional radiation, the radiation having an energy level of at least 1.6 eV. A CT system including an X-ray radiation detector is also disclosed.