Patent · US Active

Magnetic resonance rapid parameter imaging method and system

US10018698B2 · kind B2 · utility

0Cited by

2References

4Claims

0Family size

Assignee

SHENZHEN INSTITUTES OF ADVANCED TECHNOLOGY CHINESE ACADEMY OF SCIENCES · CN

Inventors

Xi Peng · Piscataway, US
Dong Liang · Lo Wu, CN
Xin Liu · Beijing, CN
Hairong Zheng · Nanhu, CN

Key dates

Filing date	Dec 5, 2014
Grant date	Jul 10, 2018
Priority date	—
Expiry date	Sep 15, 2035

Classification

Technology area (CPC G)Physics
CPC primaryG01R33/5611
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

Disclosed is a magnetic resonance rapid parameter imaging method and system. The method comprises: obtaining a target undersampled magnetic resonance signal (S10); obtaining prior information of a parameter model (S20); performing sequence reconstruction of a target image according to the undersampled magnetic resonance signal and the prior information to obtain a target image sequence (S30); and substituting the target image sequence into the parameter estimation model to obtain object parameters and to generate parametric images (S40).

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.