Methods and systems for image differentiated multiplex assays
US10019815B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 16, 2017 |
| Grant date | Jul 10, 2018 |
| Priority date | — |
| Expiry date | Mar 16, 2037 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30072
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Provided herein are methods, systems, devices, and computer-readable storage media for measuring flatness (e.g., along a Z-axis) of a detection stage. In some aspects, measuring flatness of the detection stage includes obtaining two or more images representing different Z coordinates of a first XY coordinate on a substantially flat substrate positioned on the detection stage; determining a sharpest Z coordinate at the first XY coordinate based on sharpness of the two or more images; obtaining two or more images representing different Z coordinates of a second XY coordinate spaced apart from the first XY coordinate on the substantially flat substrate; determining a sharpest Z coordinate at the second XY coordinate based on sharpness of the two or more images; and calculating a difference between the sharpest Z coordinates at the first and the second XY coordinates to measure the flatness of the detection stage.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.