Three-dimensional object scanning feedback
US10019839B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 30, 2016 |
| Grant date | Jul 10, 2018 |
| Priority date | — |
| Expiry date | Jul 10, 2036 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2200/04
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Examples of providing feedback regarding a scan of a three-dimensional object are described. In one example, a method of computer modeling a three-dimensional object includes computer-tracking a three-dimensional pose of a scanning device relative to the three-dimensional object as the three-dimensional pose of the scanning devices changes to measure different contours of the three-dimensional object from different vantage points, and assessing a sufficiency of contour measurements from one or more of the different vantage points based on measurements received from the scanning device. The example method further includes providing haptic feedback, via a haptic output device, indicating the sufficiency of contour measurements corresponding to a current three-dimensional pose of the scanning device.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.