Panel defect detection method and organic light-emitting display device using the same
US10019950B2 · kind B2 · utility
3Cited by
1References
17Claims
0Family size
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Key dates
| Filing date | May 27, 2016 |
| Grant date | Jul 10, 2018 |
| Priority date | — |
| Expiry date | Oct 15, 2036 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG09G2330/12
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
A panel defect detection method and an organic light emitting display device. A region having a high probability of a panel defect is intensively sensed through panel defect detection based on sensing results of characteristic values according to subpixels on sensing subpixel lines in an amount equal to the number of sensing subpixel lines preset in specific regions rather than all regions of a display panel. Rates and accuracy in detection of panel defects can be improved.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.