Apparatus for in-line testing and surface analysis on a mechanical property tester
US10024776B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jul 20, 2016 |
| Grant date | Jul 17, 2018 |
| Priority date | — |
| Expiry date | Aug 15, 2036 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N19/02
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An apparatus for in-line testing and surface analysis of a sample contains a base which stationarily supports a column and moveably supports an optical microscope, an interferometer, and at least test unit such as a scratch and abrasive wear tester that are moveable on the column in the Z-axis direction. A sample secured on a sample table, which is supported by a replaceable tribology drive unit on an X-stage that may position the sample under the microscope, interferometer, or test unit. Depending on the type of the test, the replaceable tribology unit may impart to the sample either a linear reciprocating movement or a rotating movement. The apparatus may operate in an automatic mode and is provided with a central processing unit that control movements of all moveable units through respective drivers via controllers connected to the central processing unit.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.