Spectrometer with random beam profiles
US10024788B2 · kind B2 · utility
1Cited by
5References
43Claims
0Family size
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Key dates
| Filing date | May 4, 2015 |
| Grant date | Jul 17, 2018 |
| Priority date | — |
| Expiry date | May 4, 2035 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2201/0633
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A spectrometer includes a light source configured to emit a beam along a beam path through a sample volume comprising an analyte. Also included is at least one detector positioned to detect at least a portion of the beam emitted by the light source, and at least one reflector positioned along the beam path intermediate the light source and the at least one detector having a surface roughness greater than a predefined level such as 20 Å RMS.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.