Probe and contact inspection device
US10024908B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 19, 2015 |
| Grant date | Jul 17, 2018 |
| Priority date | — |
| Expiry date | Nov 19, 2035 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R1/07314
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A probe comprises a first end that contacts and separates from a test object and a second end that contacts a circuit board to perform inspection of the test object. The second end is provided with a rotation restricted portion that restricts rotation of the probe about the axial direction thereof. An extendable portion, which is freely extendable and contractible in the axial direction of the probe and has at least one spiral slit, is provided between the first end and the second end. The second end is formed by a tubular member. Also, at least two of the extendable portions are provided between the first end and the second end, and an intermediate portion is formed between the extendable portions.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.