Dynamically measuring the integrity of a computing apparatus
US10025925B2 · kind B2 · utility
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1References
19Claims
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Assignee
Inventors
Key dates
| Filing date | Jun 23, 2015 |
| Grant date | Jul 17, 2018 |
| Priority date | — |
| Expiry date | Mar 22, 2036 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F21/552
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
The present disclosure includes methods and systems for measuring the integrity of a device. A number of embodiments can include initiating an observatory in a system and initiating a remote manager. A number of embodiments can also include measuring the integrity of the device from the observatory and accessing the integrity measurement of the device from the remote manager.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.