System and method of creating and using a reference device profile
US10026090B2 · kind B2 · utility
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12Claims
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Key dates
| Filing date | Dec 8, 2014 |
| Grant date | Jul 17, 2018 |
| Priority date | — |
| Expiry date | Apr 2, 2035 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/3409
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method is provided for determining a reference device profile. Device profiles are gathered from a plurality of devices having at least one characteristic in common. Each device profile has a plurality of parameter values. The device profiles are compared according to at least one device health metric. Parameter values associated with an optimum value of the device health metric are identified. Using these identified parameter values, a reference device profile is compiled. A method is also provided for enabling a target device to be conformed with a reference device profile.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.