Method and device for sealant coating inspection
US10026162B2 · kind B2 · utility
Assignees
Inventors
Key dates
| Filing date | Dec 8, 2015 |
| Grant date | Jul 17, 2018 |
| Priority date | — |
| Expiry date | Jun 23, 2036 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30121
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The present disclosure provides a method and a device of inspecting a sealant coating on a substrate. An image of a sample substrate is captured. The sample substrate is selected from a plurality of substrates. A non-coating area is identified from the image of the sample substrate. Abnormal points are identified in the non-coating area. Positions of the abnormal points are recorded. An image of a sealant-coated substrate having a sealant coating on one of the plurality of substrates is captured. Defect positions of the sealant coating are identified from the image of the sealant-coated substrate. Defects located in a non-coating area of the sealant-coated substrate at positions corresponding to the positions of the abnormal points identified based on the sample substrate are considered as normal.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.