Image recognition base ablation pattern position recall
US10026195B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Mar 14, 2014 |
| Grant date | Jul 17, 2018 |
| Priority date | — |
| Expiry date | Jul 24, 2034 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J49/0463
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Embodiments of the present invention exemplarily described herein relate generally to saving XYZ stage coordinates for intended laser locations as well as a kernel image of an ablation pattern placed during a scan placement process, and comparing the kernel image to a current image of the current field of view of a camera/microscope that includes the location a laser would be fired at. This comparison is used during an experimental run to correct for any built up error. More particularly, embodiments of the present invention relate to apparatuses and methods for software based image recognition to correct errors in open looped systems for positioning a sample relative to a laser in analysis systems for zircon crystal grain dating.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.