Program temperature aware data scrub
US10026483B1 · kind B1 · utility
20Cited by
7References
20Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jun 28, 2017 |
| Grant date | Jul 17, 2018 |
| Priority date | — |
| Expiry date | Jun 28, 2037 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C2029/0409
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Techniques disclosed herein cope with cross-temperature effects in non-volatile memory systems. One technology disclosed herein includes an apparatus and method that scrubs a block of non-volatile memory cells responsive to a determination that variance in word line program temperatures in the block exceeds a threshold. Such blocks having large variance in programming temperatures for different word lines can potentially have high BERs when reading. This may be due to the difficulty in having one set of read levels that are optimum for all word lines in the block.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.